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Journal description
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Details for article 55 of 95 found articles
| Title: |
Modeling indium diffusion in germanium by connecting point defect parameters with bulk properties |
| Author: |
Chroneos, A. Vovk, R. V. |
| Appeared in: |
Journal of materials science. Materials in electronics |
| Paging: | Volume 26 (2014) nr. 4 pages 2113-2116 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 55 of 95 found articles
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