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                                       Details for article 9 of 61 found articles
 
 
  Domain structure and leakage mechanism of BiFeO3 thin films deposited at different temperatures
 
 
Title: Domain structure and leakage mechanism of BiFeO3 thin films deposited at different temperatures
Author: Li, Huiqin
Liu, Jingsong
Liao, Qilong
Zhang, Wanli
Zhang, Shuren
Appeared in: Journal of materials science. Materials in electronics
Paging: Volume 25 (2014) nr. 7 pages 2998-3002
Year: 2014
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 61 found articles
 
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