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New method to control defect reaction induced by electron-hole recombination for long-living widegap light-emitting devices |
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Titel: |
New method to control defect reaction induced by electron-hole recombination for long-living widegap light-emitting devices |
Auteur: |
Adachi, Masahiro Hashimoto, Yutaka Kanzaki, Katsuhisa Ohashi, Shuji Morita, Yasuhiro Abe, Tomoki Kasada, Hirofumi Ando, Koshi Tajima, Michio |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 19 (2008) nr. 1 pagina's 299-302 |
Jaar: |
2008 |
Inhoud: |
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Uitgever: |
Springer US, Boston |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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