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Using differential evanescent light intensity for evaluating profiles and growth rates in KrF laser photodeposited nanostructures |
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Titel: |
Using differential evanescent light intensity for evaluating profiles and growth rates in KrF laser photodeposited nanostructures |
Auteur: |
Socol, G. Axente, E. Oane, M. Voicu, L. Dinescu, A. Petris, A. Vlad, V. Mihailescu, I. N. Mirchin, N. Margolin, R. Naot, D. Peled, A. |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 18 (2007) nr. 1 pagina's 207-211 |
Jaar: |
2007 |
Inhoud: |
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Uitgever: |
Kluwer Academic Publishers-Plenum Publishers, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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