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Journal description
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Details for article 5 of 125 found articles
| Title: |
A structural characterization of AlN thin film deposited on a single crystal Al2O3(0 0 0 1) substrate |
| Author: |
K. H. KIM C. H. CHANG Y. M. KOO |
| Appeared in: |
Journal of materials science letters |
| Paging: | Volume 16 (1997) nr. 17 pages 3 p. |
| Year: |
1997-/1998-998 |
| Contents: | |
| Publisher: |
Chapman and Hall |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 125 found articles
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