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Journal description
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Details for article 45 of 54 found articles
| Title: |
Structural characterization and transistor properties of thickness-controllable MoS2 thin films |
| Author: |
Jeong, Yesul Sung, Ji Yeong Choi, Yunju Jin, Jong Sung Yoon, Jang-Hee Heo, Sinae Hayakawa, Ryoma Wakayama, Yutaka |
| Appeared in: |
Journal of materials science |
| Paging: | Volume 54 (2019) nr. 10 pages 7758-7767 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 45 of 54 found articles
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