Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 32 of 35 found articles
 
 
  Structural and electrical properties of Ge-doped ZrO2 thin films grown by atomic layer deposition for high-k dielectrics
 
 
Title: Structural and electrical properties of Ge-doped ZrO2 thin films grown by atomic layer deposition for high-k dielectrics
Author: Park, Bo-Eun
Lee, Yujin
Oh, Il-Kwon
Noh, Wontae
Gatineau, Satoko
Kim, Hyungjun
Appeared in: Journal of materials science
Paging: Volume 53 (2018) nr. 21 pages 15237-15245
Year: 2018
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 32 of 35 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands