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Journal description
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Details for article 39 of 61 found articles
| Title: |
Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction |
| Author: |
Wyss, Andreas Sologubenko, Alla S. Mishra, Nilesha Gruber, Patric A. Spolenak, Ralph |
| Appeared in: |
Journal of materials science |
| Paging: | Volume 52 (2017) nr. 11 pages 6741-6753 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 61 found articles
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