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Journal description
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Details for article 28 of 31 found articles
| Title: |
Structural characterization of through silicon vias |
| Author: |
Bender, H. Drijbooms, C. Marcke, P. Van Geypen, J. Philipsen, H. G. G. Radisic, A. |
| Appeared in: |
Journal of materials science |
| Paging: | Volume 47 (2010) nr. 18 pages 6497-6504 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 31 found articles
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