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Journal description
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Details for article 19 of 26 found articles
| Title: |
Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network |
| Author: |
Ye, Shujiao Wang, Zheng Xiong, Pengbo Xu, Xinhao Du, Lintong Tan, Jiubin Wang, Weibo |
| Appeared in: |
Journal of intelligent manufacturing |
| Paging: | Volume 35 () nr. 6 pages 2653-2669 |
| Year: |
2023-06-28 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 26 found articles
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