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Journal description
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Details for article 16 of 25 found articles
| Title: |
GAN-based statistical modeling with adaptive schemes for surface defect inspection of IC metal packages |
| Author: |
Wu, Zhenshuang Cai, Nian Chen, Kaiqiong Xia, Hao Zhou, Shuai Wang, Han |
| Appeared in: |
Journal of intelligent manufacturing |
| Paging: | Volume 35 () nr. 4 pages 1811-1824 |
| Year: |
2023-05-23 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 25 found articles
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