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                                       Details for article 7 of 12 found articles
 
 
  Identification of process disturbance using SPC/EPC and neural networks
 
 
Title: Identification of process disturbance using SPC/EPC and neural networks
Author: Chiu, Chih-Chou
Shao, Yuehjen E.
Lee, Tian-Shyug
Lee, Ker-Ming
Appeared in: Journal of intelligent manufacturing
Paging: Volume 14 (2003) nr. 3-4 pages 379-388
Year: 2003
Contents:
Publisher: Kluwer Academic Publishers, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 12 found articles
 
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