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Journal description
All volumes of the corresponding journal
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Details for article 4 of 9 found articles
| Title: |
Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer |
| Author: |
Kim, Hyoung-Kook Jone, Wen-Ben Wang, Laung-Terng |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 26 (2010) nr. 3 pages 367-392 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 9 found articles
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