|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 8 of 30 found articles
| Title: |
Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors |
| Author: |
Liu, Xiao Hsiao, Michael S. Chakravarty, Sreejit Thadikaran, Paul J. |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 19 (2003) nr. 4 pages 437-445 |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 30 found articles
| << previous | next >> |