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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 15 of 18 found articles
| Title: |
Structural Fault Based Specification Reduction for Testing Analog Circuits |
| Author: |
Soon-Jyh Chang Chung Len Lee Jwu E. Chen |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 18 (2002) nr. 6 pages 11 p. |
| Year: |
2002-12 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston, U.S.A |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 18 found articles
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