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                                       Details for article 6 of 16 found articles
 
 
  Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
 
 
Title: Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Author: Abhijit Jas
Nur A. Touba
Appeared in: Journal of electronic testing
Paging: Volume 18 (2002) nr. 4 pages 12 p.
Year: 2002-08/10-/10
Contents:
Publisher: Kluwer Academic Publishers, Boston, U.S.A
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 16 found articles
 
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