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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 16 of 24 found articles
| Title: |
Module Level Weighted Random Patterns |
| Author: |
Savir, Jacob |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 10 (1997) nr. 3 pages 283-287 |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 24 found articles
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