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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 17 found articles
| Title: |
Embedded System Level Self-Test for Mixed-Signal IO Verification |
| Author: |
Loukusa, V. |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 22 (2006) nr. 4-6 pages 463-470 |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 17 found articles
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