Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 35 of 68 found articles
 
 
  Growth and characterization of UHV sputtering HfO2 film by plasma oxidation and low temperature annealing
 
 
Title: Growth and characterization of UHV sputtering HfO2 film by plasma oxidation and low temperature annealing
Author: Li, Q.
Wang, S. J.
Wang, W. D.
Chi, D. Z.
Huan, A. C. H.
Ong, C. K.
Appeared in: Journal of electroceramics
Paging: Volume 16 (2006) nr. 4 pages 517-521
Year: 2006
Contents:
Publisher: Kluwer Academic Publishers, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 35 of 68 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands