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                                       Details for article 22 of 51 found articles
 
 
  Intrinsic parameter fluctuations due to random grain orientations in high-κ gate stacks
 
 
Title: Intrinsic parameter fluctuations due to random grain orientations in high-κ gate stacks
Author: Brown, Andrew R.
Watling, Jeremy R.
Asenov, Asen
Appeared in: Journal of computational electronics
Paging: Volume 5 () nr. 4 pages 333-336
Year: 2006-12-09
Contents:
Publisher: Kluwer Academic Publishers-Plenum Publishers, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 51 found articles
 
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