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                                       Details for article 18 of 62 found articles
 
 
  3D Monte Carlo Analysis of Discrete Dopant Effects on Electron noise in Si Devices
 
 
Title: 3D Monte Carlo Analysis of Discrete Dopant Effects on Electron noise in Si Devices
Author: Dollfus, P.
VeláZquez, J. E.
Bournel, A.
Galdin-Retailleau, S.
Appeared in: Journal of computational electronics
Paging: Volume 3 (2004) nr. 3-4 pages 311-315
Year: 2004
Contents:
Publisher: Kluwer Academic Publishers, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 62 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands