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Journal description
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Details for article 9 of 18 found articles
| Title: |
Donor-induced electrically charged defect levels: examining the role of indium and n-type defect-complexes in germanium |
| Author: |
Igumbor, Emmanuel |
| Appeared in: |
Journal of computational electronics |
| Paging: | Volume 23 () nr. 4 pages 697-706 |
| Year: |
2024-06-18 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 18 found articles
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