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Journal description
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Details for article 35 of 71 found articles
| Title: |
Impacts of core gate thickness and Ge content variation on the performance of Si1−xGex source/drain Si–nanotube JLFET |
| Author: |
Thakur, Anchal Dhiman, Rohit |
| Appeared in: |
Journal of computational electronics |
| Paging: | Volume 20 () nr. 1 pages 237-247 |
| Year: |
2021-01-02 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 71 found articles
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