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                                       Details for article 29 of 36 found articles
 
 
  Study of the electrical parameters of a dual-material double-gate TFET using a strained type II staggered Ge1−x−ySixSny/Ge1−a−bSiaSnb heterojunction
 
 
Title: Study of the electrical parameters of a dual-material double-gate TFET using a strained type II staggered Ge1−x−ySixSny/Ge1−a−bSiaSnb heterojunction
Author: Shaw, Namrata
Mukhopadhyay, Bratati
Sen, Gopa
Appeared in: Journal of computational electronics
Paging: Volume 19 () nr. 4 pages 1433-1443
Year: 2020-06-30
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 29 of 36 found articles
 
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