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                                       Details for article 33 of 41 found articles
 
 
  Reliable high-yield CNTFET-based 9T SRAM operating near threshold voltage region
 
 
Title: Reliable high-yield CNTFET-based 9T SRAM operating near threshold voltage region
Author: Patel, Pramod Kumar
Malik, M. M.
Gupta, Tarun K.
Appeared in: Journal of computational electronics
Paging: Volume 17 (2018) nr. 2 pages 774-783
Year: 2018
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 41 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands