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Journal description
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Details for article 28 of 57 found articles
| Title: |
Impact analysis of statistical variability on the accuracy of a propagation delay time compact model in nano-CMOS technology |
| Author: |
Jooypa, Hamed Dideban, Daryoosh |
| Appeared in: |
Journal of computational electronics |
| Paging: | Volume 17 (2017) nr. 1 pages 192-204 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 57 found articles
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