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                                       Details for article 49 of 49 found articles
 
 
  Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations
 
 
Title: Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations
Author: Abbas, Zia
Olivieri, Mauro
Ripp, Andreas
Appeared in: Journal of computational electronics
Paging: Volume 15 (2016) nr. 4 pages 1424-1439
Year: 2016
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 49 of 49 found articles
 
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