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Journal description
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Details for article 35 of 44 found articles
| Title: |
Role of annealing temperature in the oxide charge distribution in high-$$\kappa $$κ-based MOS devices: simulation and experiment |
| Author: |
Biswas, Debaleen Chakraborty, Ayan Chakraborty, Supratic |
| Appeared in: |
Journal of computational electronics |
| Paging: | Volume 15 (2016) nr. 3 pages 795-800 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 44 found articles
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