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  A numerical study of forming voltage and switching polarity dependence on Ti top electrode thickness in Zr$$\mathrm{O}_2$$O2 RRAM
 
 
Title: A numerical study of forming voltage and switching polarity dependence on Ti top electrode thickness in Zr$$\mathrm{O}_2$$O2 RRAM
Author: Berco, Dan
Tseng, Tseung-Yuen
Appeared in: Journal of computational electronics
Paging: Volume 15 (2015) nr. 2 pages 595-601
Year: 2015
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 40 found articles
 
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