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                                       Details for article 12 of 30 found articles
 
 
  IR-Fourier Spectroscopy of Attenuated Total Internal Reflection of Polyimide Films on Single-Crystal Silicon Wafers
 
 
Title: IR-Fourier Spectroscopy of Attenuated Total Internal Reflection of Polyimide Films on Single-Crystal Silicon Wafers
Author: Prosolovich, V. S.
Brinkevich, D. I.
Grinyuk, E. V.
Brinkevich, S. D.
Kolos, V. V.
Zubova, O. A.
Lastovskii, S. B.
Appeared in: Journal of applied spectroscopy
Paging: Volume 91 () nr. 2 pages 302-306
Year: 2024-05-10
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 30 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands