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Details for article 22 of 30 found articles
| Title: |
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions |
| Author: |
Bazarov, V. V. Nuzhdin, V. I. Valeev, V. F. Vorobev, V. V. Osin, Yu. N. Stepanov, A. L. |
| Appeared in: |
Journal of applied spectroscopy |
| Paging: | Volume 83 (2016) nr. 1 pages 47-50 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 30 found articles
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