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                                       Details for article 27 of 27 found articles
 
 
  X-ray fluorescence method for determining the mass absorption coefficient in two-layer thin-film Ti/Ge and Ni/Ge systems
 
 
Title: X-ray fluorescence method for determining the mass absorption coefficient in two-layer thin-film Ti/Ge and Ni/Ge systems
Author: Mashin, N. I.
Lebedeva, R. V.
Tumanova, A. N.
Ershov, A. A.
Appeared in: Journal of applied spectroscopy
Paging: Volume 79 (2012) nr. 2 pages 307-311
Year: 2012
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 27 found articles
 
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