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                                       Details for article 15 of 23 found articles
 
 
  Measurement of the thickness of thin polymer layers by infrared frustrated total internal reflection spectroscopy
 
 
Title: Measurement of the thickness of thin polymer layers by infrared frustrated total internal reflection spectroscopy
Author: Nikonenko, N. A.
Tretinnikov, O. N.
Appeared in: Journal of applied spectroscopy
Paging: Volume 75 (2008) nr. 6 pages 878-882
Year: 2008
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 23 found articles
 
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