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Journal description
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Details for article 6 of 8 found articles
| Title: |
Material contrast studies of conductive thin films on semiconductor substrates using scanning electrochemical microscopy |
| Author: |
Hanekamp, Patrick Raith, Timo Iffelsberger, Christian Zankl, Tobias Robl, Werner Matysik, Frank-Michael |
| Appeared in: |
Journal of applied electrochemistry |
| Paging: | Volume 49 (2019) nr. 5 pages 455-463 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 8 found articles
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