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                                       Details for article 4 of 23 found articles
 
 
  Application of the Standard Tapping Mode of an Atomic-Force Microscope for Local Investigations of the Electronic System of Carbon Nanotubes under Vacuum Conditions
 
 
Title: Application of the Standard Tapping Mode of an Atomic-Force Microscope for Local Investigations of the Electronic System of Carbon Nanotubes under Vacuum Conditions
Author: Zhukov, A. A.
Appeared in: Instruments and experimental techniques
Paging: Volume 65 () nr. 1 pages 152-156
Year: 2022-03-12
Contents:
Publisher: Pleiades Publishing, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 23 found articles
 
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