Testing a 32-channel integrated circuit for recording signals of silicon detectors
Title:
Testing a 32-channel integrated circuit for recording signals of silicon detectors
Author:
Atkin, E. V. Volkov, Yu. A. Voronin, A. G. Dement’ev, D. V. Il’yushchenko, I. I. Karmanov, D. E. Klyuev, A. D. Kudryashov, I. A. Lobanov, A. A. Podorozhnyi, D. M. Shumikhin, V. V.