Digital Library
Close Browse articles from a journal
 
<< previous   
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 16 of 16 found articles
 
 
  Testing a 32-channel integrated circuit for recording signals of silicon detectors
 
 
Title: Testing a 32-channel integrated circuit for recording signals of silicon detectors
Author: Atkin, E. V.
Volkov, Yu. A.
Voronin, A. G.
Dement’ev, D. V.
Il’yushchenko, I. I.
Karmanov, D. E.
Klyuev, A. D.
Kudryashov, I. A.
Lobanov, A. A.
Podorozhnyi, D. M.
Shumikhin, V. V.
Appeared in: Instruments and experimental techniques
Paging: Volume 55 (2012) nr. 4 pages 456-461
Year: 2012
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 16 found articles
 
<< previous   
 
 Koninklijke Bibliotheek - National Library of the Netherlands