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                                       Details for article 18 of 30 found articles
 
 
  Integrated circuit failure analysis using physical ion sputtering
 
 
Title: Integrated circuit failure analysis using physical ion sputtering
Author: Vyatkin, A. F.
Zinenko, V. I.
Appeared in: Instruments and experimental techniques
Paging: Volume 54 (2011) nr. 2 pages 268-272
Year: 2011
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 30 found articles
 
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