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Journal description
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Details for article 19 of 27 found articles
| Title: |
Detecting X-ray refraction in weakly absorbing thin films of beryllium and carbon |
| Author: |
Touriyanskii, A. G. Pirshin, I. V. Teleushev, Yu. Zh. |
| Appeared in: |
Instruments and experimental techniques |
| Paging: | Volume 52 (2009) nr. 1 pages 113-121 |
| Year: |
2009 |
| Contents: | |
| Publisher: |
SP MAIK Nauka/Interperiodica, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 27 found articles
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