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Journal description
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Details for article 30 of 44 found articles
| Title: |
In situConductance Measurement of Surface Phases on Silicon by the Four-Probe Method |
| Author: |
Belous, I. A. Utas, O. V. Tsukanov, D. A. Lifshits, V. G. |
| Appeared in: |
Instruments and experimental techniques |
| Paging: | Volume 44 (2001) nr. 5 pages 698-699 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers-Plenum Publishers, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 30 of 44 found articles
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