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Journal description
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Details for article 38 of 58 found articles
| Title: |
Effect of Hot Carriers and Ionizing Radiation on the Spectrum of Interface States in MOS Transistors |
| Author: |
Lomakin, S. S. Zebrev, G. I. |
| Appeared in: |
Instruments and experimental techniques |
| Paging: | Volume 43 (2000) nr. 6 pages 810-814 |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers-Plenum Publishers, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 38 of 58 found articles
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