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Details van artikel 29 van 31 gevonden artikelen
| Titel: |
Optimum combined test plans for systems and components |
| Auteur: |
Rajgopal, Jayant Mazumdar, Mainak Majety, Subba Rao V. |
| Verschenen in: |
IIE transactions |
| Paginering: | Jaargang 31 (1999) nr. 6 pagina's 481-490 |
| Jaar: |
1999-06-01 |
| Inhoud: |
Since mathematical models based on component reliabilities are frequently used for prediction of system reliability, it stands to reason that cost-effective inferences on the reliability of a system could be made on the basis of tests of its constituent components. Prior research in the area of system-based component testing has for the most part addressed the development of plans that test only the components. From a practitioner's point of view, this is an issue of concern since system failures are often caused by imperfect interfaces and other causes that are not directly attributable to component failures. The exclusion of system tests may thus be an erroneous approach. This paper addresses the development of test plans that explicitly consider the possibility of interface failures. The paper analyzes a series system to determine when testing should be performed on the system alone, on the components only, and on both, depending on test costs and interface reliabilities. Optimum test plans are: derived by solving a two-stage mathematical program. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 29 van 31 gevonden artikelen
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