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Details van artikel 17 van 31 gevonden artikelen
| Titel: |
Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection |
| Auteur: |
Tsung, Fugee Shi, Jianjun |
| Verschenen in: |
IIE transactions |
| Paginering: | Jaargang 31 (1999) nr. 6 pagina's 517-527 |
| Jaar: |
1999-06-01 |
| Inhoud: |
An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARM A (1,1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 17 van 31 gevonden artikelen
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