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Details van artikel 17 van 36 gevonden artikelen
| Titel: |
Double-stage inspection for screening multi-characteristic items |
| Auteur: |
Greenshtein, Eitan Rabinowitz, Gad |
| Verschenen in: |
IIE transactions |
| Paginering: | Jaargang 29 (1997) nr. 12 pagina's 1057-1061 |
| Jaar: |
1997-12-01 |
| Inhoud: |
Final product inspection of a multi-attribute product, such as in the electronic assembly industry, involves expensive facilities. The correlation among attributes may be used for reducing the efforts needed for screening the products; however, engineers without an appropriate statistical-economical analysis tools do not take risks, and they designate full inspection of each item. We propose a double stage inspection program for reducing inspection efforts. Assuming that the joint distribution is known, the conditional probability that a product is “good” may be evaluated conditional upon the observation of the product's first-stage inspected quality attributes. Then, an expected cost minimization is implemented in order to decide whether a second inspection stage is required or a classification should be based solely on the first inspection stage. The cost factors include inspection and false classification. The method is illustrated on a real data set from a particular electronic product of Motorola-Arad Ltd. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 17 van 36 gevonden artikelen
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