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| Titel: |
AGE-AND-TEST PROCEDURES FOR TRUE RELIABILITY IMPROVEMENT: FEASIBILITY AND ECONOMIC JUSTIFICATION |
| Auteur: |
Barber, James S. Gehner, Kenneth R. |
| Verschenen in: |
IIE transactions |
| Paginering: | Jaargang 24 (1992) nr. 5 pagina's 81-87 |
| Jaar: |
1992-11-01 |
| Inhoud: |
Manufacturers use a variety of age-and-test procedures, such as device burn-in and environmental stress screening, for purposes beyond that of simply ensuring that a product meets its functional specifications. These procedures were originally employed because many products have decreasing failure rate functions, and therefore products shipped after screening exhibit improved reliability. However, recent emphasis on quality and reliability has expanded the scope of age-and-test to a process for the early identification of the root causes of failure, leading to corrective action and true reliability improvement. We investigate the necessary and sufficient conditions on the failure distribution for the feasibility of using age-and-test as a means for providing ac curate identification of long term reliability problems. A study is presented that indicates the necessary conditions hold and die procedure is in fact feasible. In order to provide a means for the economic justification of age-and-test, we develop a cost-benefit model for general age-and-test procedures that includes the benefits from both screening and the early eradication of the root causes of failure. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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