|
| << vorige | volgende >> |
Tijdschrift beschrijving
Alle jaargangen van het bijbehorende tijdschrift
Alle afleveringen van het bijbehorende jaargang
Alle artikelen van de bijbehorende aflevering
Details van artikel 14 van 20 gevonden artikelen
| Titel: |
OPTIMAL BURN-IN SIMULATION ON HIGHLY INTEGRATED CIRCUIT SYSTEMS |
| Auteur: |
Chien, Wei-Ting Kary Kuo, Way |
| Verschenen in: |
IIE transactions |
| Paginering: | Jaargang 24 (1992) nr. 5 pagina's 33-43 |
| Jaar: |
1992-11-01 |
| Inhoud: |
Bum-in, a screening technique to improve product reliability, is especially useful for highly integrated circuit systems. But, in most applications, the resulting systems reliability after burn-in is worse than what has been forecasted, because of “incompatibility” not only among components but also among different subsystems and at the system level. To deal with this phenomenon, we present a simulation method to compensate for the lack of field data. Also, a stress-strength model is implemented using weighted factors and a model based on nonlinear programming theory is designed to find the optimal burn-in policy that satisfies the reliability requirement and cost restriction. The program presented here can serve as an “IC Information Query System” for system designers to consider at the design stage. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 14 van 20 gevonden artikelen
| << vorige | volgende >> |