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Details for article 1 of 15 found articles
| Title: |
Characterization of palladium-related defects in silicon |
| Author: |
Dogra, R. Byrne, A. P. Brett, D. A. Ridgway, M. C. |
| Appeared in: |
Hyperfine interactions |
| Paging: | Volume 177 (2008) nr. 1-3 pages 33-37 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer Netherlands, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 15 found articles
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