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Journal description
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Details for article 41 of 104 found articles
| Title: |
Identification of Defects in Semiconductors via their Electric Field Gradients |
| Author: |
Thomas Wichert Stephan Lany |
| Appeared in: |
Hyperfine interactions |
| Paging: | Volume 136 (2001) nr. 3 pages 13 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Dordrecht, The Netherlands |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 104 found articles
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