Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 9 of 67 found articles
 
 
  A new binary chaos-based metaheuristic algorithm for software defect prediction
 
 
Title: A new binary chaos-based metaheuristic algorithm for software defect prediction
Author: Arasteh, Bahman
Arasteh, Keyvan
Ghaffari, Ali
Ghanbarzadeh, Reza
Appeared in: Cluster computing
Paging: Volume 27 () nr. 7 pages 10093-10123
Year: 2024-05-04
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 67 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands