Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 6 of 14 found articles
 
 
  Dipole Localization and Test-Retest Reliability of Frequency and Duration Mismatch Negativity Generator Processes
 
 
Title: Dipole Localization and Test-Retest Reliability of Frequency and Duration Mismatch Negativity Generator Processes
Author: Frodl-Bauch, Thomas
Kathmann, Norbert
Möller, Hans-Jürgen
Hegerl, Ulrich
Appeared in: Brain topography
Paging: Volume 10 (1997) nr. 1 pages 3-8
Year: 1997
Contents:
Publisher: Kluwer Academic Publishers-Plenum Publishers, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 14 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands