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                                       Details for article 15 of 26 found articles
 
 
  In situ dark field microscopy for on-line monitoring of yeast cultures
 
 
Title: In situ dark field microscopy for on-line monitoring of yeast cultures
Author: Wei, Ning
You, Jia
Friehs, Karl
Flaschel, Erwin
Nattkemper, Tim Wilhelm
Appeared in: Biotechnology letters
Paging: Volume 29 (2006) nr. 3 pages 373-378
Year: 2006
Contents:
Publisher: Kluwer Academic Publishers, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 26 found articles
 
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